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Hamamatsu Photonics' new film thickness meter to advance productivity in semiconductor manufacturing
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Hamamatsu Photonics' new film thickness meter to advance productivity in semiconductor manufacturing
Hamamatsu Photonics has developed the HyperGauge thickness measurement system C17319-11 to enhance productivity in semiconductor manufacturing processesThe new film-thickness measurement system features Hamamatsu's proprietary wavelength detection technology, “λ-Capture,” which uses a high-sensitivity camera to allow full-surface measurement of wafers up to 300nm in diameter in five seconds.The HyperGauge In-Plane Film Thickness Meter C17319-11 …
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