JEOL: Sales launch of HAXIS: The New Low-angle Ion Milling Scanning Electron Microscope
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5 Articles
TOKYO-- (BUSINESS WIRE)--Oct 5, 2026--
JEOL: Sales launch of HAXIS: The New Low-angle Ion Milling Scanning Electron Microscope
TOKYO — JEOL Ltd. (President & CEO Izumi Oi) announces the development of its new low‑angle ion‑milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026. HAXIS Low-angle Ion Milling Scanning Electron Microscope Background of development As advanced semiconductor device structures continue to shrink and grow more complex, it has become difficult […]
JEOL Launches HAXIS, the New Low-Angle Ion Milling Scanning Electron Microscope
JEOL Ltd. (President & CEO Izumi Oi) recently announced the development of its new low‑angle ion‑milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026. HAXIS Low-angle Ion Milling Scanning Electron Microscope Background of development As advanced semiconductor device structures continue to shrink and grow more complex, it has become difficult to […]
TOKYO–(BUSINESS WIRE)– JEOL Ltd. announces the development of HAXIS, its new scanning electron microscope with a small-angle ion polishing system, and sales begin today, October 5, 2026. This press release contains multimedia. View the full press release here: https://www.businesswire.com/news/home/20260928369666/nl/ HAXIS Low-angle Ion Milling Scanning Electron Microscope HAXIS scanning electron microscope with small-angle ion polishing system …
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