Published • loading... • Updated
Advanced Spectral Technology to Demonstrate the Zentura Wafer-Level Metrology System at the 2026 Kyushu Semiconductor Industry Exhibition
- Advanced Spectral Technology, Inc. will demonstrate its Zentura Wafer Level Metrology System at the 2026 Kyushu Semiconductor Industry Exhibition in Fukuoka City, Japan, on September 30 and October 1, 2026.
- AST will showcase a live Zentura system at the NANYO Corporation booth with an AST applications engineer available for technical discussions during the exhibition.
- The Zentura system measures wafer thickness, adhesive layer thickness, etch depth, wafer shape, and vision-based critical dimensions on wafers up to 300mm with high precision.
- Zentura is a configurable platform that supports manual or fully automated loading, integrates different sensor technology to match specific wafer-level metrology requirements, and is compatible with ISO 5 and ISO 4 cleanroom standards.
Insights by Ground AI
34 Articles
34 Articles
Farm Talk Newspaper+33 Reposted by 33 other sources
Advanced Spectral Technology to Demonstrate the Zentura Wafer-Level Metrology System at the 2026 Kyushu Semiconductor Industry Exhibition
AST will show a live Zentura system at the NANYO Corporation booth at Marine Messe Fukuoka, September 30 to October 1, 2026, with an AST applications engineer on-site for technical discussions.
·Parsons, United States
Read Full ArticleCoverage Details
Total News Sources34
Leaning Left6Leaning Right4Center17Last UpdatedBias Distribution63% Center
Bias Distribution
- 63% of the sources are Center
63% Center
L 22%
C 63%
15%
Factuality
To view factuality data please Upgrade to Premium
